Browsing by Author Bhaduri, B.

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Showing results 1 to 14 of 14
Issue DateTitleAuthor(s)
2007(1,N) spatial phase-shifting technique in digital speckle pattern interferometry and digital shearography for nondestructive evaluationBhaduri, B.; Mohan, N.K.; Kothiyal, M.P.
2008A comparative study of phase-shifting algorithms in digital speckle pattern interferometryBhaduri, B.; Kothiyal, M.P.; Mohan, N.K.
2006A dual-function ESPI system for the measurement of out-of-plane displacement and slopeBhaduri, B.; Mohan, N.K.; Kothiyal, M.P.
2006A TV holo-shearography system for NDEBhaduri, B.; Krishna Mohan, N.; Kothiyal, M.P.
2007Curvature measurement using three-aperture digital shearography and fast Fourier transformBhaduri, B.; Kothiyal, M.P.; Krishna Mohan, N.
2006Cyclic-path digital speckle shear pattern interferometer: Use of polarization phase-shifting methodBhaduri, B.; Krishna Mohan, N.; Kothiyal, M.P.
2007Digital speckle pattern interferometry (DSPI) with increased sensitivity: Use of spatial phase shiftingBhaduri, B.; Kothiyal, M.P.; Krishna Mohan, N.
2008Digital speckle pattern interferometry using spatial phase shifting: Influence of intensity and phase gradientsBhaduri, B.; Mohan, N.K.; Kothiyal, M.P.
2008Evaluation of surface roughness based on monochromatic speckle correlation using image processingDhanasekar, B.; Mohan, N.K.; Bhaduri, B.; Ramamoorthy, B.
2007Measurement of surface figure of plane optical surfaces with polarization phase-shifting Fizeau interferometerChatterjee, S.; Kumar, Y.P.; Bhaduri, B.
2008Microscopic TV holography for MEMS deflection and 3-D surface profile characterizationPaul Kumar, U.; Bhaduri, B.; Krishna Mohan, N.; Kothiyal, M.P.; Asundi, A.K.
2007Simultaneous measurement of out-of-plane displacement and slope using a multiaperture DSPI system and fast Fourier transformBhaduri, B.; Mohan, N.K.; Kothiyal, M.P.
2009Two-wavelength micro-interferometry for 3-D surface profilingKumar, U.P.; Bhaduri, B.; Kothiyal, M.P.; Mohan, N.K.
2006Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)Bhaduri, B.; Krishna Mohan, N.; Kothiyal, M.P.; Sirohi, R.S.