Browsing by Author Kothiyal, M.P.

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Issue DateTitleAuthor(s)
2007(1,N) spatial phase-shifting technique in digital speckle pattern interferometry and digital shearography for nondestructive evaluationBhaduri, B.; Mohan, N.K.; Kothiyal, M.P.
2008A comparative study of phase-shifting algorithms in digital speckle pattern interferometryBhaduri, B.; Kothiyal, M.P.; Mohan, N.K.
2006A dual-function ESPI system for the measurement of out-of-plane displacement and slopeBhaduri, B.; Mohan, N.K.; Kothiyal, M.P.
1998A phase-conjugate Twyman-Green interferometer with increased sensitivity for laser beam collimationDarlin, J.S.; Kothiyal, M.P.; Sirohi, R.S.
2006A TV holo-shearography system for NDEBhaduri, B.; Krishna Mohan, N.; Kothiyal, M.P.
1998Achromatic phase shifting by a rotating polarizerSuja Helen, S.; Kothiyal, M.P.; Sirohi, R.S.
1976Analysis of polarized light with imperfect componentsKothiyal, M.P.
2001Analysis of spectrally resolved white light interferograms: Use of a phase shifting techniqueHelen, S.S.; Kothiyal, M.P.; Sirohi, R.S.
1998Assessment of surface geometry using confocal scanning optical microscopeUdupa, G.; Singaperumal, M.; Sirohi, R.S.; Kothiyal, M.P.
2011Characterization of micro-lenses based on single interferogram analysis using Hilbert transformationKumar, U.P.; Mohan, N.K.; Kothiyal, M.P.
2000Characterization of surface topography by confocal microscopy: I. Principles and the measurement systemUdupa, G.; Singaperumal, M.; Sirohi, R.S.; Kothiyal, M.P.
2000Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularitiesUdupa, G.; Singaperumal, M.; Sirohi, R.S.; Kothiyal, M.P.
2011Comparative study of time average and stroboscopic illumination techniques for vibration fringe analysisKumar, U.P.; Somasundaram, U.; Mohan, N.K.; Kothiyal, M.P.
2006Contrast reversal and enhancement of phase spot array/grid with an intensity-dependent refractive index medium as phase filterSendhil, K.; Vijayan, C.; Kothiyal, M.P.
1991Curvature and focal length measurements using compensation of a collimated beamSriram, K.V.; Kothiyal, M.P.; Sirohi, R.S.
2007Curvature measurement using three-aperture digital shearography and fast Fourier transformBhaduri, B.; Kothiyal, M.P.; Krishna Mohan, N.
2006Cyclic-path digital speckle shear pattern interferometer: Use of polarization phase-shifting methodBhaduri, B.; Krishna Mohan, N.; Kothiyal, M.P.
2009Deformation and shape measurement using multiple wavelength microscopic TV holographyKumar, U.P.; Mohan, N.K.; Kothiyal, M.P.; Asundi, A.K.
2007Design of a low power optical limiter based on a new nanocomposite material incorporating silica-encapsulated phthalocyanine in NafionSathiyamoorthy, K.; Vijayan, C.; Kothiyal, M.P.
1982Detection of defects in plates and diaphragms using a split-lens speckle-shearing interferometerKrishna Murthy, R.; Sirohi, R.S.; Kothiyal, M.P.