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Electrical surface-resistivity, dielectric resonance, polarization and magnetic properties of Bi<inf>0.5</inf>Sr<inf>0.5</inf>FeO<inf>3-δ</inf> thin films grown by pulsed laser deposition
Date Issued
03-09-2014
Author(s)
Balamurugan, K.
Indian Institute of Technology, Madras
Surendra, M. Krishna
Indian Institute of Technology, Madras
Rao, M. S.Ramachandra
Indian Institute of Technology, Madras
Abstract
Polycrystalline and highly preferred (1 0 2̄) orientated Bi 0.5Sr0.5FeO3-δ thin films were grown by pulsed laser deposition (PLD) on n-Si (2 0 0) and MgO (2 0 0) single crystalline substrates respectively. The thin films were inspected using x-ray diffraction, scanning electron microscopy, energy dispersive x-ray spectroscopy and atomic force microscopy techniques. The electrical surface-resistivity, dielectric resonance, electric polarization, and magnetic properties of the thin films were studied. At room temperature, depending on deposition conditions, the polycrystalline thin films grown on n-Si substrates were found to exhibit an electrical surface-resistivity of the order of 103106 ω, a piezoelectric resonance in the frequency range of about 2526 MHz, a relaxor-type ferroelectric hysteresis with a maximum polarization of 0.0150.055μCcm?2 and magnetic hysteresis. Similarly, the thin films grown on MgO substrates exhibited an electrical surface-resistivity of the order of 109 ω, multiple piezoelectric resonances in the frequency range of about 845 MHz, a linear variation of polarization with applied electric field and either a linearly varying magnetization or magnetic hysteresis which depends on the deposition conditions.© 2014 IOP Publishing Ltd Printed in the UK.
Volume
47