A built-in-self-test scheme for segmented and binary weighted DACs

This paper describes a new Built-In-Self-Test(BIST) scheme for estimation of static non-linearity errors in segmented and binary weighted digital to analog converters (DACs). The BIST scheme comprises of a hierarchy of tests including tests for non-monotonicity, checks to detect if the DNL/INL errors exceed ±0.5 LSB and actual estimation of the DNL/INL. The BIST scheme has been experimentally verified on 10-bit segmented current steering DAC. The DAC, along with the additional circuits required for testing, was designed and fabricated using a 0.35 μm process. Both simulation and experimental results are included in this paper. Errors estimated using the BIST scheme match well with measurements done on the fabricated device. © 2004 Kluwer Academic Publishers.