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Evidence for direct CP violation in B <sup>±</sup>→ηh <sup>±</sup> and observation of B0→ηK0
Date Issued
20-01-2012
Author(s)
Hoi, C. T.
Chang, P.
Aihara, H.
Asner, D. M.
Aushev, T.
Bakich, A. M.
Belous, K.
Bhardwaj, V.
Bhuyan, B.
Bischofberger, M.
Bondar, A.
Bozek, A.
BraÄ ko, M.
Browder, T. E.
Chang, M. C.
Chao, Y.
Chen, A.
Chen, K. F.
Chen, P.
Cheon, B. G.
Chilikin, K.
Cho, K.
Choi, Y.
Danilov, M.
Drásal, Z.
Drutskoy, A.
Eidelman, S.
Fast, J. E.
Gaur, V.
Gabyshev, N.
Goh, Y. M.
Golob, B.
Haba, J.
Hayasaka, K.
Hoshi, Y.
Hou, W. S.
Hsiung, Y. B.
Hyun, H. J.
Inami, K.
Ishikawa, A.
Iwabuchi, M.
Iwasaki, Y.
Iwashita, T.
Kang, J. H.
Kawasaki, T.
Kim, H. J.
Kim, H. O.
Kim, J. B.
Kim, J. H.
Kim, K. T.
Kim, M. J.
Kinoshita, K.
Ko, B. R.
Kobayashi, N.
Kodyš, P.
Korpar, S.
Križan, P.
Kuhr, T.
Kumita, T.
Kwon, Y. J.
Lee, S. H.
Li, J.
Indian Institute of Technology, Madras
Liu, Z. Q.
Louvot, R.
Matvienko, D.
McOnie, S.
Miyabayashi, K.
Miyata, H.
Mohanty, G. B.
Moll, A.
Nakano, E.
Nakao, M.
Neubauer, S.
Nishida, S.
Nishimura, K.
Nitoh, O.
Ohshima, T.
Okuno, S.
Park, C. W.
Park, H. K.
Pedlar, T. K.
Pestotnik, R.
PetriÄ , M.
Piilonen, L. E.
Ritter, M.
Röhrken, M.
Sahoo, H.
Sakai, Y.
Sanuki, T.
Schneider, O.
Schwanda, C.
Schwartz, A. J.
Senyo, K.
Sevior, M. E.
Shapkin, M.
Shebalin, V.
Shen, C. P.
Shibata, T. A.
Shiu, J. G.
Abstract
We report measurements of the branching fractions and CP asymmetries for B ±→ηh ± (h=K or π) and the observation of the decay B0→ηK0 from the final data sample of 772×106BB̄ pairs collected with the Belle detector at the KEKB asymmetric-energy e +e - collider. The measured branching fractions are B(B ±→ηK ±)=(2. 12±0.23±0.11)×10 -6, B(B ±→ηπ ±)=(4.07±0. 26±0.21)×10 -6, and B(B0→ηK0)=(1.27-0.29+0. 33±0.08)×10 -6, where the last decay is observed for the first time with a significance of 5.4 standard deviations (σ). We also find evidence for CP violation in the charged B modes, A CP(B ±→ηK ±)=-0.38±0.11±0. 01 and A CP(B ±→ηπ ±)=- 0.19±0.06±0.01 with significances of 3.8σ and 3.0σ, respectively. For all measurements, the first and second uncertainties are statistical and systematic, respectively. © 2012 American Physical Society.
Volume
108