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Direct imaging of lattice planes in atomically precise noble metal cluster crystals using a conventional transmission electron microscope
Date Issued
11-02-2022
Author(s)
Mahendranath, Ananthu
Mondal, Biswajit
Sugi, Korath Shivan
Indian Institute of Technology, Madras
Abstract
Imaging finer structural details of atomically precise noble metal cluster crystals has been difficult with electron microscopy, owing to their extreme beam sensitivity. Here we present a simple method whereby lattice planes in single crystals of nanoclusters can be observed using a conventional transmission electron microscope, enabling further expansion of cluster research. This journal is
Volume
58