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Simultaneous implementation of Leendertz and Duffy's methods for in-plane displacement measurement
Date Issued
01-03-1996
Author(s)
Mohan, N. Krishna
Santhanakrishnan, T.
Senthilkumaran, P.
Sirohi, R. S.
Abstract
Leendertz two-beam illumination and Duffy's two-aperture arrangements are two well established optical configurations in speckle interferometry for in-plane displacement measurement. However, the measurement sensitivities of both these techniques are quite different. In Leendertz method the interbeam angle between the two illumination beams determines the sensitivity, while in Duffy's arrangement, it is governed by the subtense formed by aperture separation at the object. In the present paper, we implement both these configurations simultaneously for in-plane displacement measurement. The proposed optical arrangement extends the range of in-plane displacement measurement considerably. Detailed theoretical and experimental results are presented.
Volume
124