Structural information on island metal films from aging measurements

A simple model and analysis is presented in this paper which allows determination of structural parameters of island films such as island nucleation density and surface coverage from simple aging and temperature variation of resistance measurements. A square-lattice model for the position of the islands on the substrate is assumed, which, together with a knowledge of the interisland separation and mean island size, allows determination of the above-mentioned parameters. The model and ensuing analysis is applied to some Cu and Al films to illustrate the technique. © 1990 The American Physical Society.