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Measurement of ultrafast relaxation times by femtosecond optical delay line
Date Issued
01-01-2002
Author(s)
Justin, Rajesh R.
Indian Institute of Technology, Madras
Abstract
Ultrafast relaxation time profiles of the order of femtoseconds (fs) can be recorded by using an optical delay line. Fabrication details of this economical and indigenous PC-controlled optical delay line along with the requirements of improving signal-to-noise ratio are given here.
Volume
31