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  1. Home
  2. Indian Institute of Technology Madras
  3. Publication10
  4. Effects of Oxide-Fixed Charge on the Breakdown Voltage of Superjunction Devices
 
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Effects of Oxide-Fixed Charge on the Breakdown Voltage of Superjunction Devices

Date Issued
07-03-2007
Author(s)
Balaji, S.
Shreepad Karmalkar 
Indian Institute of Technology, Madras
DOI
10.1109/LED.2007.891261
Abstract
Superjunction devices may employ oxide layers for termination and for isolating adjacent pillars. Fixed charges present in these oxide layers are shown to have the following influence on the device breakdown voltage Vbr. The effect of a positive fixed charge is equivalent to an increase in the n-pillar charge. The resulting charge imbalance degrades Vbr, and can be compensated either by increasing the p-pillar doping or by decreasing the n-pillar doping by an amount ≈ (1.27NfT + 4NfI)/(pillar width), where NfTand NfI are the fixed charges in the termination and isolation oxides, respectively. Contrary to expectation, the Vbrof such compensated devices can be significantly higher than that of a balanced superjunction of the same doping level without fixed charge, due to the uniform lateral depletion effect of the fixed charge. © 2007, IEEE. All rights reserved.
Volume
28
Subjects
  • Breakdown

  • charge

  • charge imbalance

  • oxide-fixed

  • superjunction

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