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Ferroelectric properties of multiferroic hexagonal er MnO<inf>3</inf> thin films
Date Issued
01-01-2009
Author(s)
Jang, Seung Yup
Lee, Daesu
Lee, Jung Hyuk
Indian Institute of Technology, Madras
Chung, Jin Seok
Abstract
The authors investigated the ferroelectric properties of epitaxial thin films of hexagonal ErMnO3 fabricated on Pt(111)Al2O 3(000l) substrates. The ferroelectric characteristics were observed with a reasonable remnant polarization value (3.0 μC/cm2 at 160 K). However, the films exhibited an unusual antiferroelectric-like behavior with a temperature- and an electric-field-dependence. The coercive field showed an abrupt increase below the antiferromagneitc ordering temperature, indicating the possibility of interference between ferroelectric domains and antiferromagnetic domains.
Volume
55
Subjects