Repository logo
  • English
  • Català
  • Čeština
  • Deutsch
  • Español
  • Français
  • Gàidhlig
  • Italiano
  • Latviešu
  • Magyar
  • Nederlands
  • Polski
  • Português
  • Português do Brasil
  • Suomi
  • Svenska
  • Türkçe
  • Қазақ
  • বাংলা
  • हिंदी
  • Ελληνικά
  • Yкраї́нська
  • Log In
    or
    New user? Click here to register.Have you forgotten your password?
Repository logo
  • Communities & Collections
  • Research Outputs
  • Fundings & Projects
  • People
  • Statistics
  • English
  • Català
  • Čeština
  • Deutsch
  • Español
  • Français
  • Gàidhlig
  • Italiano
  • Latviešu
  • Magyar
  • Nederlands
  • Polski
  • Português
  • Português do Brasil
  • Suomi
  • Svenska
  • Türkçe
  • Қазақ
  • বাংলা
  • हिंदी
  • Ελληνικά
  • Yкраї́нська
  • Log In
    or
    New user? Click here to register.Have you forgotten your password?
  1. Home
  2. Indian Institute of Technology Madras
  3. Publication9
  4. Investigation on production of highly textured Sb doped polycrystalline silicon using solid state Nd: YAG laser for photovoltaic application
 
  • Details
Options

Investigation on production of highly textured Sb doped polycrystalline silicon using solid state Nd: YAG laser for photovoltaic application

Date Issued
03-05-2010
Author(s)
Palani, I. A.
Nilesh J Vasa 
Indian Institute of Technology, Madras
Singaperumal, M.
Okada, T.
DOI
10.1117/12.841105
Abstract
Efficient doping of amorphous silicon(a-Si) is a key issue in the field of photovoltaic applications. In this paper an attempt has been made to produce a highly highly textured Sb doped a-Si. The a-Si were coated with Sb to a thickness of 200nm using vacuum evaporation method and treated with an Nd:YAG laser of 355nm with a threshold fluence of 460mJ/cm2 by overlapping the laser spots to 90% of its size. The samples are retretaed with a low laser fluence of 230mJ/cm2 respectively so as to crytsallize and diffuse the Sb on to the surface and to activate the dopant. The laser doped and subequently laser textured samples were analysed through Scanning Electron microscope (SEM), X-ray diffraction (XRD) & Atomic Force Microscope(AFM).The traces of SiSb in the XRD peak with improved surface roughness were observed on the laser doped samples. This represents that the dopants are highly diffused on the a-Si. © 2010 Copyright SPIE - The International Society for Optical Engineering.
Volume
7584
Subjects
  • Amorphous silicon (a-...

  • Crystallization

  • Laser annealing

  • Laser doping

  • Laser texturization

  • Nd:YAG

Indian Institute of Technology Madras Knowledge Repository developed and maintained by the Library

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Cookie settings
  • Privacy policy
  • End User Agreement
  • Send Feedback