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  1. Home
  2. Indian Institute of Technology Madras
  3. Publication8
  4. Creep damage characterization using a low amplitude nonlinear ultrasonic technique
 
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Creep damage characterization using a low amplitude nonlinear ultrasonic technique

Date Issued
01-03-2011
Author(s)
Krishnan Balasubramanian 
Indian Institute of Technology, Madras
Valluri, Jitendra S.
Raghu V Prakash 
Indian Institute of Technology, Madras
DOI
10.1016/j.matchar.2010.11.007
Abstract
This paper describes a new nonlinear ultrasonic (NLU) technique for creep damage characterization. Traditionally, nonlinear material response is evaluated at high amplitude levels. The present paper evaluates the nonlinear response of samples at much lower amplitude levels than used in any previous study of nonlinear material behavior. The newly observed nonlinear behavior occurs when dislocations are constrained between two quiescent lattice planes as defined by Cantrell. Three parameters are used to characterize the low amplitude nonlinear response during the progression of creep damage in 99.98% pure copper specimens studied here; these are parameters that characterize (a) the static displacement, (b) the second harmonic and (c) the third harmonic components of the ultrasonic through-transmitted signal. Various features of the received NLU amplitude vs. input amplitude to the ultrasonic transducer were observed to correlate well with micro-void concentrations caused by creep damage. © 2010 Elsevier Inc. All rights reserved.
Volume
62
Subjects
  • Copper

  • Creep damage

  • Low amplitude

  • NLU

  • Nonlinear ultrasonic

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