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Electronic speckle pattern interferometry for simultaneous measurement of out-of-plane displacement and slope
Date Issued
01-11-1993
Author(s)
Mohan, N. Krishna
Saldner, H.
Molin, N. E.
Abstract
An optical configuration is presented for simultaneous measurement of out-of-plane displacement and slope change in electronic speckle pattern interferometry. Experimental results for a rectangular plate clamped along the edges and loaded at the center are presented. © 1993 Optical Society of America.
Volume
18