Repository logo
  • English
  • Català
  • Čeština
  • Deutsch
  • Español
  • Français
  • Gàidhlig
  • Italiano
  • Latviešu
  • Magyar
  • Nederlands
  • Polski
  • Português
  • Português do Brasil
  • Suomi
  • Svenska
  • Türkçe
  • Қазақ
  • বাংলা
  • हिंदी
  • Ελληνικά
  • Yкраї́нська
  • Log In
    or
    New user? Click here to register.Have you forgotten your password?
Repository logo
  • Communities & Collections
  • Research Outputs
  • Fundings & Projects
  • People
  • Statistics
  • English
  • Català
  • Čeština
  • Deutsch
  • Español
  • Français
  • Gàidhlig
  • Italiano
  • Latviešu
  • Magyar
  • Nederlands
  • Polski
  • Português
  • Português do Brasil
  • Suomi
  • Svenska
  • Türkçe
  • Қазақ
  • বাংলা
  • हिंदी
  • Ελληνικά
  • Yкраї́нська
  • Log In
    or
    New user? Click here to register.Have you forgotten your password?
  1. Home
  2. Indian Institute of Technology Madras
  3. Publication12
  4. Effect of overlayers on the instability of copper island films
 
  • Details
Options

Effect of overlayers on the instability of copper island films

Date Issued
01-04-1988
Author(s)
Pattabi, Manjunatha
Sivaramakrishnan, V.
DOI
10.1007/BF01154623
Abstract
The results of investigations carried out on the effect of overlayers of Al2O3, SiO2 and MoO3 on the instability of discontinuous copper films at room temperature and at 125 K, are reported. For one film, long-term stability was studied for more than 1500 h. The overlayers are inadequate in preventing movement of the islands both at room temperature and at 125 K and in providing protection against attack by atmospheric gases. The films, when exposed to the atmosphere, show a large increase in resistance in a well-defined pressure range of ≃5 × 10-2 torr, corroborating our earlier findings. The I-V characteristics at 125 K were nonlinear, the non-linearity being attributed to field-induced structural changes. © 1988 Chapman and Hall Ltd.
Volume
23
Indian Institute of Technology Madras Knowledge Repository developed and maintained by the Library

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Cookie settings
  • Privacy policy
  • End User Agreement
  • Send Feedback