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Flow stress/strain rate/grain size coupling for fcc nanopolycrystals

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cris.author.scopus-author-id8045960800
cris.author.scopus-author-id7202921411
dc.contributor.authorArmstrong, R. W.
dc.contributor.authorRodriguez, P.
dc.date.accessioned2023-09-20T05:32:11Z
dc.date.available2023-09-20T05:32:11Z
dc.date.issued21-12-2006
dc.description.abstractA Hall-Petch (H-P)-type dependence is demonstrated for reciprocal activation volume measurements for nanocrystalline and conventional grain size, strengthened Ni and Cu materials, consistent with predictions derived from the dislocation pile-up model. The observed H-P dependence indicates that the shear stress for cross-slip must be involved in the full grain size regime for transmission of plastic flow at the grain boundaries of fcc metals.
dc.identifier.doi10.1080/14786430600764872
dc.identifier.issn14786435
dc.identifier.scopus2-s2.0-33750079578
dc.identifier.urihttps://apicris.irins.org/handle/IITM2023/47899
dc.relation.ispartofseriesPhilosophical Magazine
dc.sourcePhilosophical Magazine
dc.titleFlow stress/strain rate/grain size coupling for fcc nanopolycrystals
dc.typeJournal
dspace.entity.typePublication
oaire.citation.endPage5796
oaire.citation.issue36
oaire.citation.startPage5787
oaire.citation.volume86
person.affiliation.cityChennai
person.affiliation.cityCollege Park
person.affiliation.id60025757
person.affiliation.id60020304
person.affiliation.nameIndian Institute of Technology Madras
person.affiliation.nameUniversity of Maryland, College Park
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