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Electron correlation effects near the photoionization threshold: The Ar isoelectronic sequence
Date Issued
29-09-2011
Author(s)
Jose, J.
Pradhan, G. B.
Radojević, V.
Manson, S. T.
Deshmukh, P. C.
Abstract
The photoionization/photodetachment of atoms/ions of the Ar (Z = 18) isoelectronic sequence is investigated using three levels of calculation: the relativistic random phase approximation (RRPA) at various levels of truncation, RRPA with relaxation (RRPA-R) and the Tamm-Dancoff approximation (TD). The evolution of correlation and relaxation effects along the isoelectronic sequence members (Cl-, Ar, K+, Sc3+, Mn7+, Cu11+, Kr18+, Mo24+ and Cd30+) is investigated. © 2011 IOP Publishing Ltd.
Volume
44