Options
A Simplified Correction for Surface Roughness Effects in X-Ray Diffractometric Investigations
Date Issued
01-01-1992
Author(s)
Vasudevan, R.
Pathiraj, B.
Abstract
The importance of surface roughness to the measurement of integrated intensity in X-ray powder diffraction is discussed following studies conducted with materials in both powder and bulk (rolled sheet/billet) forms possessing different absorption characteristics. A simple procedure is described which allows for surface roughness effect. © 1992, Cambridge University Press. All rights reserved.
Volume
7