Investigation of oxygen chemisorption on the surface of CdSe<inf>0.8</inf>Te<inf>0.2</inf> thin films by X-ray photoelectron spectroscopy and transmission electron microscopy

The results of oxygen chemisorption studies performed on the surface of CdSe0.8Te0.2 thin films by X-ray photoelectron spectroscopy (XPS) and transmission electron microscopy (TEM) are reported. Films deposited at various substrate temperatures, differing deposition rates and of different thicknesses exhibited instability in film resistance with time (aging) when exposed to oxygen and atmosphere. An oxygen chemisorption model is used to explain the aging of the films in oxygen and atmosphere. The increased aging exhibited by films deposited at low rates and low substrate temperatures may be attributed to the greater number of selenium vacancies available for oxygen chemisorption. This was further supported by XPS and TEM of the films. © 1990.