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Influence of multiple-exposure recording on curvature pattern using multi-aperture speckle shear interferometry
Date Issued
15-12-2000
Author(s)
Mohan, Nandigana Krishna
Abstract
A method based on multiple exposures in binomial mode of recording and its influence of curvature pattern is presented. Since the curvature information is obtained as a beat moire between two sets of slope patterns, a multiple-exposure technique can be implemented to sharpen the background slope fringes to enhance the visibility of the curvature fringes.
Volume
186