Transport properties of Bi<inf>2</inf>Te<inf>2.4</inf>Se<inf>0.6</inf> thin films

Annealed Bi2Te2.4Se0.6 thin films grown on glass plates by the flash evaporation technique at room temperature in vacuum, were investigated for their thermoelectric and electrical properties in the temperature range 300 K-480 K. Structural analysis indicated the polycrystalline nature of the films with hexagonal structure. Grain size was calculated from the electron micrograph. As temperature increased, the thermoelectric properties power of the films increased in the low temperature range and then decreased after reaching a maximum due to the evaporation of volatile components. Thermoelectric studies indicated an n-type conductivity.