X-Ray Scattering by Antiphase Ferroelectric Domain Walls in the Antiferroelectric Phase of the PbZr$$:{0.985}$$ Ti$$:{0.015}$$ O$$:3$$

The results of the X-ray diffuse scattering (DS) measurements of the Zr-rich PbZrO3 - PbTiO3 solid solution PbZr0.985 Ti0.015O3 (PZT1.5) are presented. Measurements were performed in zero electric field and in applied electric field E = 5KV /cm. In the antiferroelectric phase diffuse scattering streaks aroundΣ superstructure peaks (Formula Presented) were found and interpreted as a scattering on ferroelectric antiphase domain walls. This conclusion is corroborated by the observation of a strong influence of the electric field on these streaks. Reported results are important for the prospective application of the antiferroelectrics as the basis for the high-density non-volatile memory devices.