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Improvement of polarization extinction in silicon waveguide devices
Date Issued
15-04-2012
Author(s)
Bhatt, G. R.
Indian Institute of Technology, Madras
Abstract
The SOI based waveguide devices are found to be highly polarization sensitive. Unwanted polarization excitations can be attenuated by integrating a TE- or TM-pass polarizer. A large attenuation of TM-polarized light has been observed when a thin film of metal is coated on the top of silicon rib waveguide, while TE-polarized light remains almost unaffected. The attenuation of TM-polarized light is attributed to the plasmonic absorption of the evanescent field in the metal cladding. Typically, with an Al cladding of thickness ∼ 100 nm and a length of 1 mm on top of a single-mode (λ ∼ 1550 nm) SOI rib waveguide structure, TE vs TM extinction ratio of ∼ 15 dB has been obtained. Integrating such waveguide polarizers in a directional coupler and MZI based DWDM channel interleaver, we have also achieved an improvement in polarization extinction by ∼ 15 dB. © 2012 Elsevier B.V. All rights reserved.
Volume
285