Investigations of surface characterization of silicone rubber due to tracking phenomena under a.c. and d.c. voltages

Date Issued
01-01-2002
Author(s)
Rao, Uma Maheswar
Majeed, S. S.M.S.Abdul
Venkataseshaiah, C.
Indian Institute of Technology, Madras
DOI
Abstract
In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric differential thermal analysis (TG-DTA) studies. The tracking time was different for a.c. and d.c. voltages.
Volume
25
Subjects