Repository logo
  • English
  • Català
  • Čeština
  • Deutsch
  • Español
  • Français
  • Gàidhlig
  • Italiano
  • Latviešu
  • Magyar
  • Nederlands
  • Polski
  • Português
  • Português do Brasil
  • Suomi
  • Svenska
  • Türkçe
  • Қазақ
  • বাংলা
  • हिंदी
  • Ελληνικά
  • Yкраї́нська
  • Log In
    or
    New user? Click here to register.Have you forgotten your password?
Repository logo
  • Communities & Collections
  • Research Outputs
  • Fundings & Projects
  • People
  • Statistics
  • English
  • Català
  • Čeština
  • Deutsch
  • Español
  • Français
  • Gàidhlig
  • Italiano
  • Latviešu
  • Magyar
  • Nederlands
  • Polski
  • Português
  • Português do Brasil
  • Suomi
  • Svenska
  • Türkçe
  • Қазақ
  • বাংলা
  • हिंदी
  • Ελληνικά
  • Yкраї́нська
  • Log In
    or
    New user? Click here to register.Have you forgotten your password?
  1. Home
  2. Indian Institute of Technology Madras
  3. Publication12
  4. Preparation and properties of zinc phosphide thin films
 
  • Details
Options

Preparation and properties of zinc phosphide thin films

Date Issued
15-02-1986
Author(s)
Murali, K. R.
Gopalam, B. S.V.
Sobhanadri, J.
DOI
10.1016/0040-6090(86)90286-5
Abstract
Zinc phosphide (Zn3P2) was prepared by the carbon reduction process. Thin films of Zn3P2 were evaporated onto glass substrates at various substrate temperatures. Films evaporated onto substrates at and above 220 °C were polycrystalline in nature. Films of different thicknesses were grown and their electrical conductivity was measured in the temperature range 100-300 K. Four characteristic energy gaps of 1.3, 1.66, 1.75 and 1.82 eV were obtained from the analysis of the optical absorption spectrum. © 1986.
Volume
136
Indian Institute of Technology Madras Knowledge Repository developed and maintained by the Library

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Cookie settings
  • Privacy policy
  • End User Agreement
  • Send Feedback