Development of a Microprocessor-Based Four Probe DC Resistivity Setup for Tc Measurement of Superconducting Materials

The design of a microprocessor-based resistivity measurement system for high Tc superconducting materials is described. This design includes interfacing an Intel 8085 microprocessor system with an IBM compatible personal computer (PC) through RS-232C serial communication. This design is used to measure resistivity for superconducting samples of YBa2Cu3O7 −x and strontium/potassium substituted YBa2Cu3O7−x. A correction method is also described for the parameters whose values are changing throughout the measurement period, to minimize the measurement errors. © 1990 IEEE