A Simple Random Test Procedure for Detection of Single Intermittent Fault in Combinational Circuits

Virupakshia, A. R.; Reddy, V. C.V.Pratapa

doi:10.1109/TC.1983.1676283

A Simple Random Test Procedure for Detection of Single Intermittent Fault in Combinational Circuits

Date Issued

01-01-1983

Author(s)

Virupakshia, A. R.

Reddy, V. C.V.Pratapa

DOI

10.1109/TC.1983.1676283

Abstract

This paper suggests a method for near-optimal selection of input vector probabilities for random testing of intermittent faults in combinational circuits. The assignment of input vector probabilities is obtained by equalizing the quality factors of all test vectors in a simple way. It is shown that the degree of fault detection is comparable with that of Savir [2]. © 1983 IEEE

Volume

C-32

Subjects

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A Simple Random Test Procedure for Detection of Single Intermittent Fault in Combinational Circuits