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PROCESS MODELING OF PHOSPHORUS DIFFUSION IN SILICON - A NEW MODEL.
Date Issued
01-12-1984
Author(s)
Eranna, G.
Kakati, Devdas
Abstract
A new process model for phosphorus diffusion into silicon is proposed. It is based on the concept that the phosphorus profile can be fitted using two independent Gaussian profiles for two diffusion coefficients, and results in the kink and tail structures of the profile.
Volume
27