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X-ray photoelectron spectroscopic studies of the valence state of Tl in single-Tl-O-layered TlBa1-xSrxLaCuO5 (0_etix_eti1)
Date Issued
01-01-1992
Author(s)
Sundaresan, A.
Gopinath, C. S.
Tamhane, A. S.
Rajarajan, A. K.
Sharon, M.
Subramanian, S.
Pinto, R.
Gupta, L. C.
Vijayaraghavan, R.
Abstract
The valence state of thallium in TlBa1-xSrxLaCuO5 (x=0.0, 0.4, 0.7, and 1.0) has been investigated by measuring Tl 4f core levels by x-ray photoelectron spectroscopy. It is shown that the valence state of Tl in TlBaLaCuO5 (nonsuperconducting) is 3+, whereas that in TlSrLaCuO5 (superconducting, Tc=32 K) is between 3+ and 1+. The origin of holes in the latter compound is discussed in terms of charge transfer between Tl ions and Cu-O layers as has been found in double-Tl-O-layered compounds. © 1992 The American Physical Society.
Volume
46